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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Stuttgart Center for Electron Microscopy: StEM     Display Documents



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ID: 435835.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Stuttgart Center for Electron Microscopy: StEM
HRTEM characterization of erbium silicide formed in ultra-high vacuum
Authors:Łaszcz, A.; Ratajczak, J.; Czerwinski, A.; Kątcki, J.; Phillipp, F.; van Aken, P. A.; Yarekha, D.; Reckinger, N.; Larrieu, G.; Dubois, E.
Language:English
Publisher:Verlag der Technischen Universität Graz, Austria
Place of Publication:Graz
Date of Publication (YYYY-MM-DD):2009
Title of Proceedings:MC2009. Vol. 3: Materials Science
Start Page:31
End Page:32
Name of Conference/Meeting:MC2009, Microscopy Conference
Place of Conference/Meeting:Graz, Austria
(Start) Date of Conference/Meeting
 (YYYY-MM-DD):
2009-08-30
End Date of Conference/Meeting 
 (YYYY-MM-DD):
2009-09-04
Review Status:Internal review
Audience:Experts Only
External Publication Status:published
Document Type:Conference-Paper
Communicated by:Fritz Phillipp
Affiliations:MPI für Intelligente Systeme/Stuttgart Center for Electron Microscopy (StEM)
External Affiliations:Institute of Electron Technology, Al. Lotników 32/46, 02-668 Warsaw, Poland;
IEMN/ISEN, UMRS CNRS 8520, Avenue Poincare, Cite Scientifique, BP 69, 59652 Villeneuve d’Ascq Cedex, France;
Université catholique de Louvain, Place du Levant 3, B-1348 Louvain-la-Neuve, Belgium.
Identifiers:DOI:10.3217/978-3-85125-062-6-388
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