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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Ehemalige Abt. Rühle (Microstructure and Interfaces)     Display Documents



  history
ID: 43726.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Ehemalige Abt. Rühle (Microstructure and Interfaces)
Ultra-high resolution electron microscopy investigations of growth defects in CVD diamond films: twin interactions and five-fold twin centres
Authors:Delclos, S.; Dorignac, D.; Phillipp, F.; Silva, F.; Gisquel, A.
Language:English
Date of Publication (YYYY-MM-DD):2000
Title of Journal:Diamond and Related Materials
Volume:9
Start Page:346
End Page:350
Review Status:Peer-review
Audience:Experts Only
External Publication Status:published
Document Type:Article
Communicated by:Fritz Phillipp
Affiliations:MPI für Metallforschung/Ehemalige Abt. Rühle/ZWE Hochspannungs-Mikroskopie
External Affiliations:Centre d'Elaboration de Matériaux et d'Etudes Structurales, CNRS, BP4347, 31055 Toulouse, France
Laboratoire d'Ingénierie des Matériaux et des Hautes Pressions, CNRS, Avenue Jean-Baptiste Clément, 93430 Villetaneuse, France
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