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          Institute: MPI für Kolloid- und Grenzflächenforschung     Collection: Grenzflächen     Display Documents



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ID: 442791.0, MPI für Kolloid- und Grenzflächenforschung / Grenzflächen
Effect of Layer-by-Layer Electrostatic Assemblies on the Surface Potential and Current Voltage Characteristic of Metal-Insulator-Semiconductor Structures
Authors:Gorin, D. A.; Yashchenok, A. M.; Manturov, A. O.; Kolesnikova, T. A.; Möhwald, H.
Language:English
Date of Publication (YYYY-MM-DD):2009-11-03
Title of Journal:Langmuir
Journal Abbrev.:Langmuir
Volume:25
Issue / Number:21
Start Page:12529
End Page:12534
Review Status:Peer-review
Audience:Not Specified
External Publication Status:published
Document Type:Article
Version Comment:Automatic journal name synchronization
Affiliations:MPI für Kolloid- und Grenzflächenforschung/Grenzflächen/Möhwald
External Affiliations:[Gorin, D. A.; Yashchenok, A. M.; Kolesnikova, T. A.] Saratov NG Chernyshevskii State Univ, Fac Nano & Biomed Technol, Saratov 410012, Russia.; [Manturov, A. O.] Saratov State Tech Univ, Fac Elect Engn & Instrument Making, Saratov 410054, Russia.
Identifiers:ISI:000271106600024 [ID No:1]
ISSN:0743-7463 [ID No:2]
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