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          Institute: Fritz-Haber-Institut     Collection: Chemical Physics     Display Documents



  history
ID: 442817.0, Fritz-Haber-Institut / Chemical Physics
Double aberration correction in a low-energy electron microscope
Authors:Schmidt, Thomas; Marchetto, Helder; Lévesque, Pierre L.; Groh, Ulli; Maier, Florian; Preikszas, Dirk; Hartel, Peter; Spehr, Rainer; Lilienkamp, Gerhard; Engel, Wilfried; Fink, Rainer; Bauer, Ernst; Rose, Harald; Umbach, Eberhard; Freund, Hans-Joachim
Language:English
Date of Publication (YYYY-MM-DD):2010
Title of Journal:Ultramicroscopy
Volume:110
Issue / Number:11
Start Page:1358
End Page:1361
Review Status:Peer-review
Audience:Experts Only
External Publication Status:published
Document Type:Article
Communicated by:Hans-Joachim Freund
Affiliations:Fritz-Haber-Institut/Chemical Physics/Spectro-Microscopy
Fritz-Haber-Institut/Chemical Physics/Spectroscopy
Fritz-Haber-Institut/Chemical Physics/Chemical Physics
External Affiliations:W. Engel, Fritz-Haber-Institut, Abteilung Molekülphysik (ehemals Oberflächenphysik), Berlin, Germany, Groh, U., Maier, F., Umbach, E, Experimentelle Physik II, Universität Würzburg, Würzburg, Germany, Preikzas, D., Hartel, P., Spehr, R., Rose, H., Angewandte Physik, TU Darmstadt, Darmstadt, Germany, Lilienkamp, G., Bauer, E., Physikalisches Institut der TU Clausthal, Clausthal, Germany, Fink, R., Physikalische Chemie II, Universität Erlangen-Nürnberg, Erlangen, Germany
Identifiers:URL:http://www.sciencedirect.com/science?_ob=ArticleUR... [only subscriber]
URL:http://dx.doi.org/10.1016/j.ultramic.2010.07.007 [only subscriber]
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