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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Emeriti and Others     Display Documents



  history
ID: 463862.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Emeriti and Others
The role of Si impurities in the transient dopant segregation and precipitation in yttrium-doped alumina
Authors:Sturm, S.; Gülgün, M. A.; Richter, G.; Morales, F. M.; Cannon, R. M.; Rühle, M.
Language:English
Date of Publication (YYYY-MM-DD):2010-01-01
Title of Journal:International Journal of Materials Research
Volume (in Journal):101
Start Page:95
End Page:101
Name of Conference/Meeting:7th International Workshop on Interfaces - New Materials via Interfacial Control
Place of Conference/Meeting:Santiago de Compostela, Spain
(Start) Date of Conference/Meeting
 (YYYY-MM-DD):
2008-06-22
End Date of Conference/Meeting 
 (YYYY-MM-DD):
2008-06-26
Review Status:Peer-review
Audience:Experts Only
External Publication Status:published
Document Type:Conference-Paper
Communicated by:Heide Klooz
Affiliations:MPI für Metallforschung/Emeriti and Others
MPI für Metallforschung/Abt. Arzt/ZWE Dünnschichtlabor
External Affiliations:Jozef Stefan Institute, Department for Nanostructured Materials, Ljubljana, Slovenia;
Sabanci University, FENS, Tuzla, Istanbul, Turkey; Universidad de Cadiz, Puerto Real, Spain;
Lawrence Berkeley National Laboratory, MSD, Berkeley, U.S.A.
Identifiers:DOI:10.3139/146.110258
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