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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Stuttgart Center for Electron Microscopy: StEM     Display Documents



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ID: 466661.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Stuttgart Center for Electron Microscopy: StEM
Characterization of ytterbium silicide formed in ultra high vacuum
Authors:Łaszcz, A.; Ratajczak, J.; Czerwinski, A.; Kątcki, J.; Srot, V.; Phillipp, F.; van Aken, P. A.; Yarekha, D.; Reckinger, N.; Larrieu, G.; Dubois, E.
Language:English
Date of Publication (YYYY-MM-DD):2010
Title of Journal:Journal of Physics: Conference Series
Volume (in Journal):209
Sequence Number:012056
Name of Conference/Meeting:16th International Conference on Microscopy of Semiconducting Materials
Place of Conference/Meeting:Oxford, United Kingdom
(Start) Date of Conference/Meeting
 (YYYY-MM-DD):
2009-03-17
End Date of Conference/Meeting 
 (YYYY-MM-DD):
2009-03-20
Review Status:not specified
Audience:Experts Only
External Publication Status:published
Document Type:Conference-Paper
Communicated by:Fritz Phillipp
Affiliations:MPI für Metallforschung/Stuttgart Center for Electron Microscopy (StEM)
External Affiliations:Institute of Electron Technology, Al. Lotników 32/46, 02-668 Warsaw, Poland;
IEMN/ISEN, UMRS CNRS 8520, Avenue Poincare, Cite Scientifique, BP 69, 59652 Villeneuve d’Ascq Cedex, France;
Université catholique de Louvain, Place du Levant 3, B-1348 Louvain-la-Neuve, Belgium.
Identifiers:DOI:10.1088/1742-6596/209/1/012056
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