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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Stuttgart Center for Electron Microscopy: StEM     Display Documents



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ID: 493214.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Stuttgart Center for Electron Microscopy: StEM
Preparation and characterization of size-controlled CeO2
nanoparticles coated with SiO2
Authors:Mao, J.; Bai, Y.; Gu, L.; van Aken, P. A.; Tu, M. J.
Language:English
Date of Publication (YYYY-MM-DD):2010
Title of Journal:Journal of Nanoparticle Resrearch
Journal Abbrev.:J. Nanopart. Res.
Volume:12
Issue / Number:6
Start Page:2045
End Page:2049
Review Status:Peer-review
Audience:Experts Only
External Publication Status:published
Document Type:Article
Communicated by:Fritz Phillipp
Affiliations:MPI für Metallforschung/Stuttgart Center for Electron Microscopy (StEM)
External Affiliations:College of Materials Science and Engineering, Sichuan University, Chengdu, Sichuan 610064, China.
Identifiers:DOI:10.1007/s11051-009-9762-3
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