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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Stuttgart Center for Electron Microscopy: StEM     Display Documents



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ID: 493458.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Stuttgart Center for Electron Microscopy: StEM
3D Elemental mapping in nanomaterials by core-loss EFTEM tomography
Authors:Jin-Phillipp, N. Y.; Koch, C. T.; van Aken, P. A.
Language:English
Date of Publication (YYYY-MM-DD):2010
Title of Journal:Microscopy and Microanalysis
Journal Abbrev.:Microsc. Microanal.
Volume (in Journal):16
Issue / Number:Suppl. 2
Start Page:1842
End Page:1843
Name of Conference/Meeting:Microscopy and Microanalysis 2010
Place of Conference/Meeting:Portland, Oregon, USA
(Start) Date of Conference/Meeting
 (YYYY-MM-DD):
2010-08-01
End Date of Conference/Meeting 
 (YYYY-MM-DD):
2010-08-05
Review Status:Internal review
Audience:Experts Only
External Publication Status:published
Document Type:Conference-Paper
Communicated by:Fritz Phillipp
Affiliations:MPI für Metallforschung/Stuttgart Center for Electron Microscopy (StEM)
Identifiers:DOI:10.1017/S1431927610056357
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