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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Abt. Mittemeijer (Phase Transformations, Thermodynamics, and Kinetics)     Display Documents



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ID: 49428.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Abt. Mittemeijer (Phase Transformations, Thermodynamics, and Kinetics)
Transmission electron microscopy investigation of the microstructure and chemistry of Si/Cu/In/Cu/Si interconnections
Authors:Sommadossi, S.; Litynska, L.; Zieba, P.; Gust, W.; Mittemeijer, E. J.
Language:English
Date of Publication (YYYY-MM-DD):2003
Title of Journal:Materials Chemistry and Physics
Volume:81
Start Page:566
End Page:568
Review Status:not specified
Audience:Experts Only
External Publication Status:published
Document Type:Article
Communicated by:Ralf Schacherl
Affiliations:MPI für Metallforschung/Abt. Mittemeijer
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