Home News About Us Contact Contributors Disclaimer Privacy Policy Help FAQ

Home
Search
Quick Search
Advanced
Fulltext
Browse
Collections
Persons
My eDoc
Session History
Login
Name:
Password:
Documentation
Help
Support Wiki
Direct access to
document ID:


          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Ehemalige Abt. Rühle (Microstructure and Interfaces)     Display Documents



  history
ID: 49870.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Ehemalige Abt. Rühle (Microstructure and Interfaces)
Transmission electron microscopy of In(Ga)As quantum dot structures
Authors:Katcki, J.; Ratajczak, J.; Laszcz, A.; Phillipp, F.; Paranthoen, C.; Cheng, X. L.; Fiore, A.; Passaseo, A.; Cingolani, R.
Language:English
Date of Publication (YYYY-MM-DD):2003
Title of Journal:Electron Technology Internet Journal
Volume:35
Start Page:1
End Page:6
Title of Issue:4
Review Status:Peer-review
Audience:Experts Only
External Publication Status:published
Document Type:Article
Communicated by:Fritz Phillipp
Affiliations:MPI für Metallforschung/Abt. Rühle/ZWE Hochspannungs-Mikroskopie
External Affiliations:Institute of Electron Technology, Warsaw, Poland;
Institut de Micro-Optoélectronique, Ecole Polytechnique, Lausanne, Switzerland;
National Nanotechnology Laboratory – INFM, Università di Lecce, Lecce, Italy
The scope and number of records on eDoc is subject to the collection policies defined by each institute - see "info" button in the collection browse view.