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          Institute: MPI für Eisenforschung GmbH     Collection: Interface Chemistry and Surface Engineering     Display Documents



  history
ID: 498837.0, MPI für Eisenforschung GmbH / Interface Chemistry and Surface Engineering
Native oxidation of sputter deposited polycrystalline copper thin films during short and long exposure times: Comparative investigation by specular and non-specular grazing incidence X-ray absorption spectroscopy
Authors:Keil, P.; Frahm, R.; Lützenkirchen-Hecht, D.
Language:English
Date of Publication (YYYY-MM-DD):2010
Title of Journal:Corrosion Science
Volume:52
Start Page:1305
End Page:1305
Review Status:not specified
Audience:Not Specified
External Publication Status:published
Document Type:Article
Affiliations:MPI für Eisenforschung GmbH
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