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          Institute: MPI für Kernphysik     Collection: Precision Spectroscopy and Ultracold Ensembles     Display Documents



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ID: 516904.0, MPI für Kernphysik / Precision Spectroscopy and Ultracold Ensembles
A deceleration system at the Heidelberg EBIT providing very slow highly charged ions for surface nanostructuring
Authors:Ginzel, R.; Higgins, S. G.; Mrowczynski, P.; Northway, P.; Simon, M. C.; Tawara, H.; Crespo López-Urrutia, J. R.; Ullrich, J.; Kowarik, G.; Ritter, R.; Meissl, W.; Vasko, C.; Gösselsberger, C.; El-Said, A. S.; Aumayr, F.
Language:English
Title of Journal:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Volume (in Journal):268
Issue / Number:19
Title of Issue:Radiation Effects in Insulators - Proceedings of the 15th International Conference on Radiation Effects in Insulators (REI)
Start Page:2972
End Page:2976
Name of Conference/Meeting:15th International Conference on Radiation Effects in Insulators (REI)
Place of Conference/Meeting:Padova, Italy
(Start) Date of Conference/Meeting
 (YYYY-MM-DD):
2009-08-30
End Date of Conference/Meeting 
 (YYYY-MM-DD):
2009-09-04
Copyright:Copyright © 2010 Elsevier B.V. All rights reserved.
Review Status:not specified
Audience:Experts Only
Abstract / Description:Recently, it has been demonstrated that each single-impact of a slow (typically 1–2 keV/u) highly charged ion (HCI) creates truly topographic and non-erasable nanostructures on CaF2 surfaces. To further explore the possibility of nanostructuring various surfaces, using mainly the potential energy stored in such HCIs, projectiles with kinetic energies as low as possible are required. For this purpose a new apparatus, capable of focusing and decelerating an incoming ion beam onto a solid or gaseous target, has been installed at the Heidelberg electron beam ion trap (EBIT). An X-ray detector and a position-sensitive particle detector are utilized to analyze the beam and collision products. First experiments have already succeeded in lowering the kinetic energy of HCIs from 10 keV/q, down to not, vert, similar30 eV/q, and in focusing the decelerated beam to spot sizes of less than 1 mm2, while maintaining the kinetic energy spread below not, vert, similar20 eV/q.
Free Keywords:Highly charged ions; Low energy ions; Ion–surface interaction; Surface nanostructuring; Electron beam ion trap
External Publication Status:published
Document Type:Conference-Paper
Communicated by:vogt
Affiliations:MPI für Kernphysik/Group of J. Ullrich/Electron Beam Ion Trap ( J.R. Crespo Lopez-Urrutia)
External Affiliations:Institut für Allgemeine Physik, Technische Universität Wien, Wiedner Hauptstr. 8-10, A-1040 Wien, Austria
Identifiers:DOI:10.1016/j.nimb.2010.05.020
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