Please note that eDoc will be permanently shut down in the first quarter of 2021!      Home News About Us Contact Contributors Disclaimer Privacy Policy Help FAQ

Home
Search
Quick Search
Advanced
Fulltext
Browse
Collections
Persons
My eDoc
Session History
Login
Name:
Password:
Documentation
Help
Support Wiki
Direct access to
document ID:


          Institute: MPI für Kernphysik     Collection: Precision Spectroscopy and Ultracold Ensembles     Display Documents



  history
ID: 521790.0, MPI für Kernphysik / Precision Spectroscopy and Ultracold Ensembles
High resolution resonant recombination measurements using evaporative cooling technique
Authors:Beilmann, C.; Crespo López-Urrutia, J. R.; Mokler, P.; Ullrich, J.
Language:English
Date of Publication (YYYY-MM-DD):2010-09
Title of Journal:Journal of Instrumentation
Journal Abbrev.:JINST
Volume (in Journal):5
Sequence Number:C09002
Name of Conference/Meeting:International Symposium on Electron Beam Ion Sources and Traps (EBIST2010)
Place of Conference/Meeting:Stockholm, Sweden
(Start) Date of Conference/Meeting
 (YYYY-MM-DD):
2010-04-07
End Date of Conference/Meeting 
 (YYYY-MM-DD):
2010-04-10
Copyright:© IOP Publishing 2010
Review Status:not specified
Audience:Experts Only
Abstract / Description:We report on a method significantly improving the energy resolution of dielectronic recombination (DR) measurements in electron beam ion traps (EBITs). The line width of DR resonances can be reduced to values distinctly smaller than the corresponding space charge width of the uncompensated electron beam. The experimental technique based on forced evaporative cooling is presented together with test measurements demonstrating its high efficiency. The principle for resolution improvement is elucidated and the limiting factors are discussed. This method opens access to high resolution DR measurements at high ion-electron collision energies required for innermost shell DR in highly charged ions (HCI).
Free Keywords:Low-energy ion storage

Ion sources (positive ions, negative ions, electron cyclotron resonance (ECR), electron beam (EBIS))

Plasma diagnostics - interferometry, spectroscopy and imaging
Classification / Thesaurus:37.20.+j Atomic and molecular beam sources and techniques 41.75.Fr Electron and positron beams 34.80.Lx Recombination, attachment, and positronium formation
External Publication Status:published
Document Type:Conference-Paper
Communicated by:vogt
Affiliations:MPI für Kernphysik/Group of J. Ullrich/Electron Beam Ion Trap ( J.R. Crespo Lopez-Urrutia)
Identifiers:DOI:doi: 10.1088/1748-0221/5/09/C09002
The scope and number of records on eDoc is subject to the collection policies defined by each institute - see "info" button in the collection browse view.