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          Institute: MPI für Plasmaphysik     Collection: Talks, Posters, Lectures     Display Documents



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ID: 522282.0, MPI für Plasmaphysik / Talks, Posters, Lectures
Ion beam analysis of porous thin films
Authors:Mayer, M.; von Toussaint, U.; Dewalque, J.; Dubreuil, O.; Henrist, C.; Cloots, R.; Mathis, F.
Language:English
Name of Conference/Meeting:20th International Conference on Ion Beam Analysis (IBA 2011)
Place of Conference/Meeting:Itapema, SC
(Start) Date of Event 
 (YYYY-MM-DD):
2011-04-10
End Date of Conference/Meeting 
 (YYYY-MM-DD):
2011-04-15
Audience:Experts Only
Document Type:Poster
Communicated by:N. N.
Affiliations:MPI für Plasmaphysik/Material Research (MF)
External Affiliations:University of Liege, Department of Chemistry, GreenMat-LCIS, B6a Sart Tilman, 3 Allee de la Chimie, 400 Liege, Belgium;
Universite of Liege - FNRS - Centre Europeen d'Archeometrie - IPNAS, B5, Sart Tilman, 3 Alee du 6 aout, 4000 Liege, Belgium
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