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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Emeriti and Others     Display Documents



ID: 534112.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Emeriti and Others
Quantitative X-ray diffraction analysis and modeling of the crystallization process in amorphous Si-B-C-N polymer derived ceramics
Authors:Tavakoli, A. H.; Gerstel, P.; Golczewski, J. A.; Bill, J.
Language:English
Date of Publication (YYYY-MM-DD):2010-05
Title of Journal:Journal of the American Ceramic Society
Journal Abbrev.:J. Am. Ceram. Soc.
Volume:93
Start Page:1470
End Page:1478
Review Status:Peer-review
Audience:Experts Only
External Publication Status:published
Document Type:Article
Communicated by:Heide Klooz
Affiliations:MPI für Metallforschung/Abt. Aldinger
External Affiliations:Institute for Materials Science, University of Stuttgart, 70569 Stuttgart, Germany
Identifiers:DOI:10.1111/j.1551-2916.2009.03591.x
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