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          Institute: MPI für Physik     Collection: MPI für Physik     Display Documents

ID: 543082.0, MPI für Physik / MPI für Physik
First results from electrical qualification measurements on DEPFET pixel detector
Authors:Majewski, Petra; Andricek, Ladislav; Lauf, Thomas; Lechner, Peter; Lutz, Gerhard; Reiffers, Jonas; Richter, Rainer; Schaller, Gerhard; Schnecke, Martina; Schopper, Florian; Soltau, Heike; Stefanescu, Alexander; Strüder, Lothar; Treis, Johannes
Date of Publication (YYYY-MM-DD):2010
Title of Journal:Proceedings of the Society of Photo-Optical Instrumentation Engineers
Journal Abbrev.:Proc.SPIE
Issue / Number:7742
Start Page:77421H
(Start) Date of Conference/Meeting
Audience:Not Specified
Intended Educational Use:No
Abstract / Description:We report on the first results from a new setup for electrical qualification measurements of DEPFET pixel detector
matrices. In order to measure the transistor properties of all pixels, the DEPFET device is placed into
a benchtest setup and electrically contacted via a probecard. Using a switch matrix, each pixel of the detector
array can be addressed individually for characterization.
These measurements facilitate to pre-select the best DEPFET matrices as detector device prior to the mounting
of the matrix and allow to investigate topics like the homogeneity of transistor parameters on device, wafer
and batch level in order to learn about the stability and reproducibility of the production process. Especially
with regard to the detector development for the IXO Wide Field Imager (WFI), this yield learning will be an
important tool.
The first electrical qualification measurements with this setup were done on DEPFET macropixel detector flight
hardware, which will form the FPAs of the Mercury Imaging X-ray Spectrometer (MIXS) on board of the 5th
ESA cornerstone mission BepiColombo. The DEPFET array consists of 64×64 macropixel for which the transfer,
output and clear characteristics were measured.
Classification / Thesaurus:Semiconductor Detectors
External Publication Status:published
Document Type:Conference-Paper
Communicated by:N.N.
Affiliations:MPI für Physik
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