Home News About Us Contact Contributors Disclaimer Privacy Policy Help FAQ

Quick Search
My eDoc
Session History
Support Wiki
Direct access to
document ID:

          Institute: MPI für Physik     Collection: MPI für Physik     Display Documents

ID: 543105.0, MPI für Physik / MPI für Physik
Large-format, high-speed, X-ray pnCCDs combined with electron an ion imaging spectrometers in a multipurpose chamber for experiments at 4th generation light sources
Authors:Strüder, Lothar; Epp, Sascha; Rolles, Daniel; Hartmann, Robert; Holl, Peter; Lutz, Gerhard; Soltau, Heike; Eckart, Rouven; Reich, Christian; Heinzinger, Klaus; Thamm, Christian; Rudenko, Artem; Krasniqi, Faton; Kühnel, Kai-Uwe; Bauer, Christian; Schröter, Claus-Dieter; Moshammer, Robert; Techert, Simone; Miessner, Danilo; Porro, Matteo; Hälker, Olaf; Meidinger, Norbert; Kimmel, Nils; Andritschke, Robert; Schopper, Florian; Weidenspointner, Georg; Ziegler, Alexander; Pietschner, Daniel; Herrmann, Sven; Pietsch, Ullrich; Walenta, Albert; Leitenberger, Wolfram; Bostedt, Christoph; Möller, Thomas; Rupp, Daniela; Adolph, Marcus; Graafsma, Heinz; Hirsemann, Helmut; Gärtner, Klaus; Richter, Rainer; Foucar, Lutz; Shoeman, Robert L.; Schlichting, Ilme; Ullrich, Joachim
Date of Publication (YYYY-MM-DD):2010
Title of Journal:Nuclear Instruments and Methods in Physics Research Section A
Journal Abbrev.:Nucl.Instrum.Meth.A
Issue / Number:614
Start Page:483
End Page:496
Audience:Not Specified
Intended Educational Use:No
Abstract / Description:Fourth generation accelerator-based light sources, such as VUV and X-ray Free Electron Lasers (FEL), deliver ultra-brilliant (~10^12-10^13 photons per bunch) coherent radiation in femtosecond (10-100 fs) pulses and, thus, require novel focal plane instrumentation in order to fully exploit their unique capabilities. As an additional challenge for detection devices, existing (FLASH, Hamburg) and future FELs (LCLS, Menlo Park; SCSS, Hyogo and the European XFEL, Hamburg) cover a broad range of photon energies from the EUV to the X-ray regime with significantly different bandwidths and pulse structures reaching up to MHz micro-bunch repetition rates. Moreover, hundreds up to trillions of fragment particles, ions, electrons or scattered photons can emerge when a single light flash impinges on matter with intensities up to 10^22 W/cm^2.
In order to meet these challenges, the Max Planck Advanced Study Group (ASG) within the Center for Free Electron Laser Science (CFEL) has designed the CFEL-ASG MultiPurpose (CAMP) chamber. It is equipped with specially developed photon and charged particle detection devices dedicated to cover large solid-angles. A variety of different targets are supported, such as atomic, (aligned) molecular and cluster jets, particle injectors for bio-samples or fixed target arrangements. CAMP houses 4 pi solid-angle ion and electron momentum imaging spectrometers ("reaction microscope", REMI, or "velocity map imaging", VMI) in a unique combination with novel, large-area, broadband (50 eV-25 keV), high-dynamic-range, single-photon-counting and imaging X-ray detectors based on the pnCCDs.
This instrumentation allows a new class of coherent diffraction experiments in which both electron and ion emission from the target may be simultaneously monitored. This permits the investigation of dynamic processes in this new regime of ultra-intense, high-energy radiation-matter interaction. After an introduction into the salient features of the CAMP chamber and the properties of the redesigned REMI/VMI spectrometers, the new 1024×1024 pixel format pnCCD imaging detector system will be described in detail. Results of tests of four smaller format (256×512) devices of identical performance, conducted at FLASH and BESSY, will be presented and the concept as well as the anticipated properties of the full, large-scale system will be elucidated. The data obtained at both radiation sources illustrate the unprecedented performance of the X-ray detectors, which have a voxel size of 75×75×450 mu m^3 and a typical read-out noise of 2.5 electrons (rms) at an operating temperature of -50 °C.
Classification / Thesaurus:Semiconductor Detectors
External Publication Status:published
Document Type:Article
Communicated by:N.N.
Affiliations:MPI für Physik
The scope and number of records on eDoc is subject to the collection policies defined by each institute - see "info" button in the collection browse view.