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          Institute: MPI für Physik     Collection: MPI für Physik     Display Documents



ID: 543432.0, MPI für Physik / MPI für Physik
The Wide Field Imager for the International X-ray
Authors:Treis, J.; Bombelli, L.; Fiorini, C.; Herrmann, S.; Lauf, T.; Lechner, P.; Lutz, G.; Majewski, P.; Porro, M.; Richter, R. H.; Stefanescu, A.; Strüder, L.; de Vita, G.
Date of Publication (YYYY-MM-DD):2009
Title of Journal:Proceedings of the Society of Photo-Optical Instrumentation Engineers
Journal Abbrev.:Proc.SPIE
Issue / Number:7435
Start Page:743506
Audience:Not Specified
Intended Educational Use:No
Abstract / Description:The large collecting area of the X-ray optics on the International X-ray Observatory (IXO), their good angular
resolution, the wide bandwidth of X-ray energies and the high radiation tolerance required for the X-ray detectors
in the focal plane have stimulated a new development of devices which unify all those science driven specifications
in one single detector. The concept of a monolithic, back-illuminated silicon active pixel sensor (APS) based on
the DEPFET structure is proposed for the IXO mission, being a fully depleted, back-illuminated 450 μm thick
detector with a physical size of about 10 × 10 cm2 corresponding to the 18 arcmin field of view. The backside
will be covered with an integrated optical light and UV-filter. Corresponding to the 5 arcsec angular resolution
of the X-ray optics, 100 x 100 μm2 large pixels in a format of approximately 1024 x 1024 are envisaged, matching
the point spread function of approximately 500 μm HEW of the optics. The energy range from 100 eV to 15 keV
is achieved by an ultra thin radiation entrance window for the low energies and 450 μm depleted silicon thickness
for higher energies. The fast readout of 1.000 full frames per second is realized by a dedicated analog CMOS
front end amplifier IC. The detector device is intrinsically radiation hard. The leakage current from the bulk
damage is controlled through the operation temperature around -60◦ C and by the high readout speed. Results
of various prototype measurements will be shown.
Classification / Thesaurus:Semiconductor Detectors
External Publication Status:published
Document Type:Article
Communicated by:N.N.
Affiliations:MPI für Physik
Identifiers:LOCALID:MPP-2009-316
URL:http://dx.doi.org/10.1117/12.826195
URL:http://publications.mppmu.mpg.de/?action=search&mp...
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