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ID:
543943.0,
MPI für Physik / MPI für Physik |
Spectroscopic silicon imaging detectors: past achievements and new developments |
Authors: | Lutz, G.; Andritschke, R.; Andricek, L.; Eckhardt, R.; Englhauser, J.; Fuchs, G.; Hälker, O.; Hartmann, R.; Heinzinger, K.; Herrmann, S.; Holl, P.; Kimmel, N.; Lechner, P.; Meidinger, N.; Porro, M.; Richter, R. - H.; Schaller, G.; Schnecke, M.; Schopper, F.; Soltau, H.; Strüder, L.; Treis, J.; Weichert, U.; Wölfl, S. | Date of Publication (YYYY-MM-DD): | 2007 | Title of Journal: | Nuclear Instruments and Methods in Physics Research Section A | Journal Abbrev.: | Nucl.Instrum.Meth.A | Issue / Number: | 2 | Start Page: | 960 | End Page: | 967 | Audience: | Not Specified | Intended Educational Use: | No | Abstract / Description: | The need of high quality spectroscopic semiconductor imaging detectors in X-ray astronomy was the principal driving force in founding the MPI Semiconductor Laboratory. Detectors developed in this laboratory are based on new function principles and are processed in the silicon detector processing line established within the laboratory. We describe the development of pnCCDs as already used in the XMM-Newton European X-ray observatory and foreseen for eROSITA, the DEPFET based pixel detector for XEUS and a new development which makes it possible to measure charge with a precision below one elementary charge. A noise value of 0.25 electron r.m.s. has already been reached. | Classification / Thesaurus: | Semiconductor Detectors | External Publication Status: | published | Document Type: | Article |
Communicated by: | N.N. | Affiliations: | MPI für Physik
| Identifiers: | LOCALID:MPP-2007-231 URL:http://publications.mppmu.mpg.de/?action=search&mp... |
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