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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Stuttgart Center for Electron Microscopy: StEM     Display Documents



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ID: 548066.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Stuttgart Center for Electron Microscopy: StEM
Characterization of chemical composition and electronic structure of Pt/YSZ interfaces by analytical transmission electron microscopy
Authors:Srot, V.; Watanabe, M.; Scheu, C.; van Aken, P. A.; Salzberger, U.; Luerßen, B.; Janek, J.; Rühle, M.
Language:English
Date of Publication (YYYY-MM-DD):2010
Title of Journal:Solid State Ionics
Volume:181
Issue / Number:35-36
Start Page:1616
End Page:1622
Review Status:Peer-review
Audience:Experts Only
External Publication Status:published
Document Type:Article
Communicated by:Fritz Phillipp
Affiliations:MPI für Metallforschung/Stuttgart Center for Electron Microscopy (StEM)
MPI für Metallforschung/Abt. Dosch/Rühle
External Affiliations:Department of Materials Science & Engineering, Lehigh University, 5 E. Packer Ave., Bethlehem, PA18015, USA;
Department of Chemistry, Ludwig-Maximilians-University of Munich, Butenandtstr. 5-13 (E), 81377 Munich, Germany;
Institute of Physical Chemistry, Justus-Liebig-University Gießen, Heinrich-Buff-Ring 58, 35392 Gießen, Germany.
Identifiers:DOI:10.1016/j.ssi.2010.08.026
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