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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Ehemalige Abt. Arzt (Micro/nanomechanics of Thin Films and Biological Systems)     Display Documents



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ID: 56097.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Ehemalige Abt. Arzt (Micro/nanomechanics of Thin Films and Biological Systems)
Effect of film thickness and grain size on fatigue-induced dislocation structures in Cu thin films
Authors:Zhang, G. P.; Schwaiger, R.; Volkert, C. A.; Kraft, O.
Language:English
Date of Publication (YYYY-MM-DD):2003
Title of Journal:Philosophical Magazine Letters
Journal Abbrev.:Phil. Mag. Lett.
Volume:83
Issue / Number:8
Start Page:477
End Page:483
Copyright:© 2003 Taylor & Francis Ltd
Review Status:not specified
Audience:Experts Only
External Publication Status:published
Document Type:Article
Communicated by:Patrick Wellner
Affiliations:MPI für Metallforschung/Abt. Arzt
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