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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Abt. Dosch/Rühle (Metastable and Low-dimensional Materials)     Display Documents



  history
ID: 563154.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Abt. Dosch/Rühle (Metastable and Low-dimensional Materials)
High-resolution core-level spectroscopy study of the ultrathin aluminum oxide film on NiAl(110)
Authors:Martin, N. M.; Knudsen, J.; Blomberg, S.; Gustafson, J.; Andersen, J. N.; Ingelsten, H.; Carlsson, P.-A.; Skoglundh, M.; Stierle, A.; Kresse, G.
Language:English
Date of Publication (YYYY-MM-DD):2011-03-22
Title of Journal:Physical Review B
Volume:83
Sequence Number of Article:125417
Review Status:Peer-review
Audience:Experts Only
External Publication Status:published
Document Type:Article
Communicated by:Peter Wochner
Affiliations:MPI für Intelligente Systeme/Abt. Dosch/Rühle
External Affiliations:Division of Synchrotron Radiation Research, Lund University, Box 118, SE-22100 Sweden;
Competence Center for Catalysis, Chalmers Universtiy of Technology, SE-41296 Göteborg, Sweden;
Arbeitsgruppe Festkörperphysik, Grenzflächen Fachbereich 7 Physik, Universität Siegen, Walter-Flex-Str. 3, 57072 Siegen;
Institut für Materialphysik, Universität Wien, A-1090 Wien, Austria
Identifiers:DOI:10.1103/PhysRevB.83.125417
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