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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Abt. Dosch/Rühle (Metastable and Low-dimensional Materials)     Display Documents



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ID: 571325.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Abt. Dosch/Rühle (Metastable and Low-dimensional Materials)
Dynamic behavior of nanometer-scale amorphous intergranular film in silicon nitride by in situ high-resolution transmission electron microscopy
Authors:Zhang, Z.; Sigle, W.; Koch, C.; Rühle, M.
Language:English
Date of Publication (YYYY-MM-DD):2011
Title of Journal:Journal of the European Ceramic Society
Volume:31
Start Page:1835
End Page:1840
Title of Issue:9
Review Status:Peer-review
Audience:Experts Only
External Publication Status:published
Document Type:Article
Communicated by:Peter Wochner
Affiliations:MPI für Intelligente Systeme/Abt. Dosch/Rühle
External Affiliations:Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Jahnstraße 12, A-8700 Leoben
Identifiers:DOI:10.1016/j.jeurceramsoc.2011.03.016
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