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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Emeriti and Others     Display Documents



  history
ID: 574220.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Emeriti and Others
Influence of nonstationary atomic mixing on depth resolution in sputter depth profiling
Authors:Wang, J. Y.; Liu, Y.; Hofmann, S.; Kovac, J.
Language:English
Date of Publication (YYYY-MM-DD):2011
Title of Journal:Surface and Interface Analysis
Volume:44
Start Page:569
End Page:572
Title of Issue:5
Review Status:Peer-review
Audience:Experts Only
External Publication Status:published
Document Type:Article
Communicated by:Heide Klooz
Affiliations:MPI für Intelligente Systeme/Emeriti and Others
External Affiliations:Department of Physics, Shantou University, 243 Daxue Road, Shantou, 515063 Guangdong, China;
Department of Surface Engineering and Optoelectronics F4, Jozef Stefan Institute, Jamova 39, 1000 Ljubljana, Slovenia
Identifiers:DOI:10.1002/sia.3855
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