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Home Search Quick Search Advanced Fulltext Browse Collections Persons My eDoc Session History Login Name: Password: Documentation Help Support Wiki Direct access to document ID:	Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Emeriti and Others     Display Documents   history ID: 574220.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Emeriti and Others Influence of nonstationary atomic mixing on depth resolution in sputter depth profiling Authors: Wang, J. Y.; Liu, Y.; Hofmann, S.; Kovac, J. Language: English Date of Publication (YYYY-MM-DD): 2011 Title of Journal: Surface and Interface Analysis Volume: 44 Start Page: 569 End Page: 572 Title of Issue: 5 Review Status: Peer-review Audience: Experts Only External Publication Status: published Document Type: Article Communicated by: Heide Klooz Affiliations: MPI für Intelligente Systeme/Emeriti and Others External Affiliations: Department of Physics, Shantou University, 243 Daxue Road, Shantou, 515063 Guangdong, China; Department of Surface Engineering and Optoelectronics F4, Jozef Stefan Institute, Jamova 39, 1000 Ljubljana, Slovenia Identifiers: DOI:10.1002/sia.3855 The scope and number of records on eDoc is subject to the collection policies defined by each institute - see "info" button in the collection browse view.