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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Stuttgart Center for Electron Microscopy: StEM     Display Documents



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ID: 575316.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Stuttgart Center for Electron Microscopy: StEM
Dynamic behavior of nanometer-scale amorphous intergranular film in silicon nitride by in situ high-resolution transmission electron microscopy
Authors:Zhang, Z.; Sigle, W.; Koch, C. T.; Rühle, M.
Language:English
Date of Publication (YYYY-MM-DD):2011
Title of Journal:Journal of the European Ceramic Society
Volume:31
Issue / Number:9
Start Page:1835
End Page:1840
Review Status:Peer-review
Audience:Experts Only
External Publication Status:published
Document Type:Article
Communicated by:Fritz Phillipp
Affiliations:MPI für Intelligente Systeme/Stuttgart Center for Electron Microscopy (StEM)
MPI für Intelligente Systeme/Ehem. Abt. Rühle
External Affiliations:Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, A-8700 Leoben, Jahnstraße 12, Austria
Identifiers:DOI:10.1016/j.jeurceramsoc.2011.03.016
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