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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Stuttgart Center for Electron Microscopy: StEM     Display Documents



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ID: 575388.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Stuttgart Center for Electron Microscopy: StEM
Epitaxial layered cobaltite NaxCoO2 thin films grown on planar and vicinal cut substrates
Authors:Yu, L.; Gu, L.; Wang, Y.; Zhang, P. X.; Habermeier, H.-U.
Language:English
Date of Publication (YYYY-MM-DD):2011
Title of Journal:Journal of Crystal Growth
Volume:328
Start Page:34
End Page:38
Review Status:Peer-review
Audience:Experts Only
External Publication Status:published
Document Type:Article
Communicated by:Fritz Phillipp
Affiliations:MPI für Intelligente Systeme/Stuttgart Center for Electron Microscopy (StEM)
MPI für Festkörperforschung
External Affiliations:Institute of Advanced Materials for Photoelectrons, Kunming University of Science and Technology, 650051 Kunming, China;
Institute of Physics, Chinese Academy of Sciences, 100190Beijing, China
Identifiers:DOI:10.1016/j.jcrysgro.2011.06.033
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