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          Institute: MPI für Eisenforschung GmbH     Collection: Microstructure Physics and Metal Forming     Display Documents



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ID: 576244.0, MPI für Eisenforschung GmbH / Microstructure Physics and Metal Forming
Characterization of grain boundaries in Cu(In,Ga)Se2 thin-film using APT
Authors:Cojocaru-Mirédin, O.; Choi, P.; Wuerz, R.; Abou-Ras, D.; Liu, T.; Schmidt, S. S.; Caballero, R.; Raabe, D.
Language:English
Name of Conference/Meeting:1st Workshop on Characterization of Grain Boundaries in CIGS-thin films
Place of Conference/Meeting:Berlin, Germany
(Start) Date of Conference/Meeting
 (YYYY-MM-DD):
2011-10-31
Audience:Not Specified
Document Type:Talk at Event
Affiliations:MPI für Eisenforschung GmbH
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