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          Institute: MPI für Eisenforschung GmbH     Collection: Microstructure Physics and Metal Forming     Display Documents



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ID: 576294.0, MPI für Eisenforschung GmbH / Microstructure Physics and Metal Forming
A (S)TEM and atom probe tomography study of InGaN
Authors:Mehrtens, T.; Bley, S.; Schowalter, M.; Sebald, K.; Seyfried, M.; Gutowski, J.; Gerstl, S. A.; Choi, P.; Raabe, D.; Rosenauer, A.
Language:English
Date of Publication (YYYY-MM-DD):2011
Title of Journal:Journal of Physics, Conference Series
Journal Abbrev.:J. Phys., Conf. Ser.
Volume (in Journal):326
Issue / Number:012029
Start Page:1
End Page:4
Name of Conference/Meeting:17th International Conference on Microscopy of Semiconducting Materials 2011
Place of Conference/Meeting:Churchill College, University of Cambridge, UK
(Start) Date of Conference/Meeting
 (YYYY-MM-DD):
2011-04-04
End Date of Conference/Meeting 
 (YYYY-MM-DD):
2011-04-07
Review Status:not specified
Audience:Not Specified
External Publication Status:published
Document Type:Conference-Paper
Affiliations:MPI für Eisenforschung GmbH
External Affiliations:Institute of Solid State Physics, University of Bremen, 28359 Bremen, Germany
Identifiers:URL:http://iopscience.iop.org/1742-6596/326/1/012029
DOI:10.1088/1742-6596/326/1/012029
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