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          Institute: MPI für Plasmaphysik     Collection: Articles, Books, Inbooks     Display Documents



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ID: 587802.0, MPI für Plasmaphysik / Articles, Books, Inbooks
Rutherford backscattering analysis of porous thin TiO2 films
Authors:Mayer, M.; von Toussaint, U.; Dewalque, J.; Dubreuil, O.; Henrist, C.; Cloots, R.; Mathis, F.
Language:English
Research Context:20th International , Itapema, SC, 2011-04-10 to 2011-04-15
Date of Publication (YYYY-MM-DD):2012
Title of Journal:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Volume:273
Start Page:83
End Page:87
Copyright:Elsevier B.V.
Review Status:Peer-review
Audience:Experts Only
External Publication Status:published
Document Type:Article
Communicated by:N. N.
Affiliations:MPI für Plasmaphysik/Plasma Edge and Wall (E2M)
External Affiliations:University of Liege, Department of Chemistry, GreenMat-LCIS, B6a Sart Tilman, 3 Allée de la Chimie, 4000 Liège, Belgium;
University of Liege – FNRS, Centre Européen d’Archéométrie – IPNAS, B5, Sart Tilman, 10 Allée du 6 aout, 4000 Liège, Belgium
Identifiers:DOI:10.1016/j.nimb.2011.07.045
URL:http://dx.doi.org/10.1016/j.nimb.2011.07.045
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