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          Institute: MPI für Kernphysik     Collection: Precision Spectroscopy and Ultracold Ensembles     Display Documents

ID: 60460.0, MPI für Kernphysik / Precision Spectroscopy and Ultracold Ensembles
Tests of a Laser Ion Source at the Heidelberg Electron Beam Ion Trap
Authors:Mironov, V.; Trinczek, M.; Werdich, A.; González Martínez, A.; Guo, P.; Zhang, X.; Braun, J.; Crespo López-Urrutia, J.R.; Höhr, C.; Ullrich, J.
Date of Publication (YYYY-MM-DD):2003
Title of Journal:Nuclear Instruments and Methods B
Start Page:183
End Page:186
Title of Issue:11th International Conference on the Physics of Highly Charged Ions
Review Status:Peer-review
Audience:Experts Only
Abstract / Description:A laser ion source (LIS) has been designed and successfully tested for loading the Heidelberg electron beam ion trap
(H-EBIT) with ions of practically all solid-state elements. A pulsed YAG:Nd3þ laser (30 mJ, 8 ns) is used to produce
plasma from a solid target. Lowly charged ions are extracted from the plasma and accelerated by a short high-voltage
pulse, generating a pulsed ion beam with energy of up to 6 keV per charge. The ion beam is transported into the EBIT,
decelerated and captured within it by switching the trapping electrode potentials. The electron beam further ionizes the
trapped ions to the desired highly charged states. The experimental setup is described together with the source parameters measured for different target materials. X-ray spectra of up to He-like highly charged ions (Cu, Mo, Pb, Al
and Ge) produced in the EBIT after injection from the LIS have been measured. The reliability and convenience of this
method allows the use of the LIS to produce highly charged ions of both insulating and conducting solid elements with
an EBIT as needed for different experiments.
External Publication Status:published
Document Type:Article
Affiliations:MPI für Kernphysik/Group J. Ullrich/Electron Beam Ion Trap ( J.R. Crespo Lopez-Urrutia)
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