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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Stuttgart Center for Electron Microscopy: StEM     Display Documents



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ID: 609585.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Stuttgart Center for Electron Microscopy: StEM
EELS and EFTEM of surface plasmons in metallic nanostructures
Authors:Sigle, W.; Gu, L.; Talebi, N.; Ögüt, B.; Koch, C. T.; Vogelgesang, R.; van Aken, P. A.
Language:English
Date of Publication (YYYY-MM-DD):2011
Title of Journal:Microscopy and Microanalysis
Journal Abbrev.:Microsc.Microanal.
Volume (in Journal):17, Suppl. 2
Full Name of Issue-Editor(s):Price, R. L.
Start Page:762
End Page:763
Name of Conference/Meeting:Microscopy and Microanalysis 2011
Place of Conference/Meeting:Nashville, Tennessee
(Start) Date of Conference/Meeting
 (YYYY-MM-DD):
2011-08-07
End Date of Conference/Meeting 
 (YYYY-MM-DD):
2011-08-11
Review Status:Internal review
Audience:Experts Only
External Publication Status:published
Document Type:Conference-Paper
Communicated by:Fritz Phillipp
Affiliations:MPI für Intelligente Systeme/Stuttgart Center for Electron Microscopy (StEM)
MPI für Festkörperforschung/Kern
External Affiliations:Photonics Research Laboratory, School of Electrical and Computer Engineering, University of Tehran, Iran
Identifiers:DOI:10.1017/S1431927611004685
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