Home News About Us Contact Contributors Disclaimer Privacy Policy Help FAQ

Home
Search
Quick Search
Advanced
Fulltext
Browse
Collections
Persons
My eDoc
Session History
Login
Name:
Password:
Documentation
Help
Support Wiki
Direct access to
document ID:


          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Abt. Schütz (Modern Magnetic Systems)     Display Documents



  history
ID: 610818.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Abt. Schütz (Modern Magnetic Systems)
Element-specific hysteresis loop measurements on individual 35 nm islands with scanning transmission X-Ray microscopy
Authors:Luo, F.; Eimüller, T.; Amaladass, E.; Lee, M. S.; Heyderman, L. J.; Solak, H. H.; Tyliszczak, T.
Language:English
Date of Publication (YYYY-MM-DD):2012
Title of Journal:Journal of Nanoscience and Nanotechnology
Journal Abbrev.:J. Nanosci. Nanotechnol.
Volume:12
Issue / Number:3
Start Page:2484
End Page:2488
Review Status:Peer-review
Audience:Experts Only
External Publication Status:published
Document Type:Article
Communicated by:Michael Hirscher
Affiliations:MPI für Intelligente Systeme/Abt. Schütz
External Affiliations:Laboratory for Micro- and Nanotechnology, Paul Scherrer Institut, Ch-5232 Villigen PSI, Switzerland;
Instituto Madrileno de Estudios Avanzados en Nanociencia (IMDEA), Madrid 28049, Spain;
Junior Research Group Magnetic Miroscopy, Experimental Physics, University of Bochum, 44780 Bochum, Germany;
Hochschule Kempten, University of Applied Sciences, Bahnhofstr. 61, 87435 Kempten, Germany;
Advanced Light Source (ALS), LBNL, 1 Cyclotron Road, Berkeley, CA 94720, USA;
Identifiers:DOI:10.1166/jnn.2012.5778
The scope and number of records on eDoc is subject to the collection policies defined by each institute - see "info" button in the collection browse view.