Home News About Us Contact Contributors Disclaimer Privacy Policy Help FAQ

Home
Search
Quick Search
Advanced
Fulltext
Browse
Collections
Persons
My eDoc
Session History
Login
Name:
Password:
Documentation
Help
Support Wiki
Direct access to
document ID:


          Institute: MPI für Plasmaphysik     Collection: Conference Papers     Display Documents



  history
ID: 624861.0, MPI für Plasmaphysik / Conference Papers
Sensitivity study of the SX tomography system on Wendelstein 7-X
Authors:Thomsen, H.; Bergmann, T.; Biedermann, C.; Dinklage, A.; König, R.; Li, D.; Marquardt, M.; Meisel, F.; Sachtleben, J.; Schülke, M.; Sieber, T.; Svensson, J.; Vorkörper, A.; Weißflog, S.; Weller, A.; Zacharias, D.; Zhang, D.
Language:English
Publisher:European Physical Society
Place of Publication:Geneva
Date of Publication (YYYY-MM-DD):2012
Title of Proceedings:39th European Physical Society Conference on Plasma Physics and 16th International Congress on Plasma Physics. Contributed Papers
Sequence Number:P2.011
Title of Series:ECA
Volume (in Series):36F
Name of Conference/Meeting:39th EPS Conference on Plasma Physics and 16th International Congress on Plasma Physics
Place of Conference/Meeting:Stockholm
(Start) Date of Conference/Meeting
 (YYYY-MM-DD):
2012-07-02
End Date of Conference/Meeting 
 (YYYY-MM-DD):
2012-07-06
Copyright:European Physical Society
Review Status:Internal review
Audience:Experts Only
External Publication Status:published
Document Type:Conference-Paper
Communicated by:N. N.
Affiliations:MPI für Plasmaphysik/DIA
MPI für Plasmaphysik/W7-X System Engineering (W7-X SE)
MPI für Plasmaphysik/Stellarator Optimization (E3)
MPI für Plasmaphysik/HC
MPI für Plasmaphysik/Plasma Edge and Wall (E2M)
External Affiliations:Department of Physics, University of California, San Diego; La Jolla CA 92093-0319 USA;
FRM II and Physics Department, Technische Universität München, Garching, Germany;
Institute of Physics, Ernst-Moritz-Arndt University, 17487 Greifswald, Germany
Identifiers:ISBN:2-914771-79-7
The scope and number of records on eDoc is subject to the collection policies defined by each institute - see "info" button in the collection browse view.