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          Institute: MPI für Chemische Physik fester Stoffe     Collection: publications 2012     Display Documents



  history
ID: 629475.0, MPI für Chemische Physik fester Stoffe / publications 2012
Structure determination of thin CoFe films by anomalous x-ray diffraction
Authors:Gloskovskii, A.; Stryganyuk, G.; Ouardi, S.; Fecher, G. H.; Felser, C.; Hamrle, J.; Pištora, J.; Bosu, S.; Saito, K.; Sakuraba, Y.; Takanashi, K.
Language:English
Date of Publication (YYYY-MM-DD):2012-10-01
Title of Journal:Journal of Applied Physics
Volume:112
Issue / Number:7
Start Page:074903-1
End Page:074903-3
Sequence Number of Article:074903
Review Status:not specified
Audience:Not Specified
External Publication Status:published
Document Type:Article
Communicated by:Ina Werner
Affiliations:MPI für chemische Physik fester Stoffe
External Affiliations:[Gloskovskii, A.; Stryganyuk, G.; Ouardi, S.; Fecher, G.H.; Felser, C.]; Institut für Anorganische und Analytische Chemie, Johannes Gutenberg-Universität, 55099 Mainz, Germany
[Hamrle, J.; Pištora, J.]; Department of Physics and Nanotechnology Centre, VSB–Technical University of Ostrava, 70833 Ostrava, Czech Republic
[Bosu, S.; Saito, K.; Sakubara, Y.; Takanashi, K.]; Institute for Materials Research (IMR), Tohoku University, Sendai 980-8577, Japan
Identifiers:DOI:10.1063/1.4755801
ISSN:0021-8979
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