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          Institute: MPI für Kernphysik     Collection: Heavy Flavour Physics     Display Documents

ID: 63168.0, MPI für Kernphysik / Heavy Flavour Physics
Enhanced Radiation Hardness and Faster Front Ends for the Beetle Readout Chip
Authors:van Bakel, Niels; van den Brand, Jo; Verkooijen, Hans; Bauer, Christian; Baumeister, Daniel; Hofmann, Werner; Knoepfle, Karl-Tasso; Loechner, Sven; Schmelling, Michael; Sexauer, Edgar; Feuerstack-Raible, Martin; Trunk, Ulrich; Harnew, Neville; Smale, Nigel
Research Context:LHCb
Place of Publication:CERN
Date of Publication (YYYY-MM-DD):2001
Title of Proceedings:Proceedings of the 7th Workshop on Electronics for LHC Experiments
Start Page:57
End Page:61
Title of Series:CERN/LHCC 2001-034
Name of Conference/Meeting:7th Workshop on Electronics for LHC Experiments
Place of Conference/Meeting:Stockholm, Sweden
(Start) Date of Conference/Meeting
End Date of Conference/Meeting 
Review Status:Internal review
Abstract / Description:This paper summarizes the recent progress in the development of the 128 channel pipelined readout chip Beetle, which is intended for the silicon vertex detector, the inner tracker, the pile-up veto trigger and the RICH detectors of LHCb.

Deficiencies found in the front end of the Beetle Version 1.0 and 1.1 chips resulted in the submissions of BeetleFE 1.1 and BeetleFE 1.2, while BeetleSR 1.0 implements test circuits to provide future Beetle chips with logic circuits hardened against single event upset (SEU).

Section I. motivates the development of new front ends for the Beetle chip, and section II. summarizes their concepts and construction. Section III. reports preliminary results from the BeetleFE 1.1 and BeetleFE 1.2 chips, while section IV. describes the BeetleSR 1.0 chip. An outlook on future test and development of the Beetle chip is given in section V.
External Publication Status:published
Document Type:Conference-Paper
Affiliations:MPI für Kernphysik/Group W. Hofmann/Heavy Flavour Physics (K. T. Knöpfle, M. Schmelling)
External Affiliations:Free University of Amsterdam, Netherlands;
NIKHEF Amsterdam, Netherlands;
University of Heidelberg, Germany;
University of Oxford, UK.
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