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          Institute: MPI für Festkörperforschung     Collection: FKF Publikationen 2003     Display Documents



  history
ID: 64781.0, MPI für Festkörperforschung / FKF Publikationen 2003
Scanning tunneling microscopy and x-ray photoelectron diffraction investigation of C60 films on Cu(100)
Authors:Abel, M.; Dmitriev, A.; Fasel, R.; Lin, N.; Barth, J. V.; Kern, K.
Language:English
Date of Publication (YYYY-MM-DD):2003
Title of Journal:Physical Review B
Volume:67
Issue / Number:24
Sequence Number of Article:245407
Review Status:not specified
Audience:Not Specified
External Publication Status:published
Document Type:Article
Communicated by:Michaela Asen-Palmer
Affiliations:MPI für Festkörperforschung
External Affiliations:Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany.
; Swiss Fed Labs Mat Testing & Res EMPA, CH-8600 Dubendorf, Switzerland.
; Ecole Polytech Fed Lausanne, Inst Phys Nanostruct, PHB Ecublens, CH-1015 Lausanne, Switzerland.
Identifiers:ISI:000184186600060 [ID No:1]
ISSN:1098-0121 [ID No:2]
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