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          Institute: MPI für Eisenforschung GmbH     Collection: Microstructure Physics and Alloy Design     Display Documents



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ID: 655852.0, MPI für Eisenforschung GmbH / Microstructure Physics and Alloy Design
Characterization of Cu(In,Ga)Se2 grain boundaries using atom probe tomography
Authors:Cojocaru-Mirédin, O.; Schwarz, T.; Choi, P.; Würz, R.; Raabe, D.
Language:English
Name of Conference/Meeting:2013 MRS Spring Meeting & Exhibit
Place of Conference/Meeting:San Francisco, CA, USA
(Start) Date of Event 
 (YYYY-MM-DD):
2013-04-01
End Date of Conference/Meeting 
 (YYYY-MM-DD):
2013-04-05
Audience:Not Specified
Document Type:Poster
Communicated by:Moderator
Affiliations:MPI für Eisenforschung GmbH
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