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          Institute: MPI für Eisenforschung GmbH     Collection: Microstructure Physics and Alloy Design     Display Documents



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ID: 668578.0, MPI für Eisenforschung GmbH / Microstructure Physics and Alloy Design
Measurement of the indium concentration in high indium content InGaN layers by scanning transmission electron microscopy and atom probe tomography
Authors:Mehrtens, T.; Schowalter, M.; Tytko, D.; Choi, P.; Raabe, D.; Hoffmann, L.; Jönen, H.; Rossow, U.; Hangleiter, A.; Rosenauer, A.
Language:English
Date of Publication (YYYY-MM-DD):2013
Title of Journal:Applied Physics Letters
Volume:102
Issue / Number:13
Start Page:4 pages
Sequence Number of Article:132112
Review Status:not specified
Audience:Not Specified
External Publication Status:published
Document Type:Article
Communicated by:Moderator
Affiliations:MPI für Eisenforschung GmbH
Identifiers:URL:dx.doi.org/10.1063/1.4799382
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