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          Institute: MPI für Eisenforschung GmbH     Collection: Structure and Nano-/Micromechanics of Materials     Display Documents



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ID: 669715.0, MPI für Eisenforschung GmbH / Structure and Nano-/Micromechanics of Materials
X-ray μLaue: A novel view on fatigue damage at the micron scale
Authors:Kirchlechner, C.; Liegl, W.; Motz, C.; Dehm, G.
Language:English
Name of Conference/Meeting:ECI on Nanomechanical Testing 2013
Place of Conference/Meeting:Olhão (Algarve), Portugal
(Start) Date of Conference/Meeting
 (YYYY-MM-DD):
2013-10-06
End Date of Conference/Meeting 
 (YYYY-MM-DD):
2013-10-11
Audience:Not Specified
Document Type:Talk at Event
Communicated by:Moderator
Affiliations:MPI für Eisenforschung GmbH
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