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          Institute: MPI für Kolloid- und Grenzflächenforschung     Collection: Kolloidchemie     Display Documents



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ID: 670097.0, MPI für Kolloid- und Grenzflächenforschung / Kolloidchemie
Structure-Properties Correlation in Si Nanoparticles by Total Scattering and Computer Simulations
Authors:Petkov, V.; Hessel, C. M.; Ovtchinnikoff, J.; Guillaussier, A.; Korgel, B. A.; Liu, X. F.; Giordano, C.
Language:English
Date of Publication (YYYY-MM-DD):2013-06-11
Title of Journal:Chemistry of Materials
Journal Abbrev.:Chem. Mat.
Volume:25
Issue / Number:11
Start Page:2365
End Page:2371
Review Status:Peer-review
Audience:Not Specified
Free Keywords:Si nanoparticles; synchrotron X-ray diffraction; atomic PDFs analysis; nanoparticle structure modeling; optical properties-nanostructure correlation
External Publication Status:published
Document Type:Article
Version Comment:Automatic journal name synchronization
Affiliations:MPI für Kolloid- und Grenzflächenforschung/Kolloidchemie
External Affiliations:[Petkov, Valeri] Cent Michigan Univ, Dept Phys, Mt Pleasant, MI 48859 USA.; [Hessel, Colin M.; Ovtchinnikoff, Justine; Guillaussier, Adrien; Korgel, Brian A.] Univ Texas Austin, Ctr Nano & Mol Sci & Technol, Texas Mat Inst, Dept Chem Engn, Austin, TX 78712 USA.
Identifiers:ISI:000320485700020 [ID No:1]
ISSN:0897-4756 [ID No:2]
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