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          Institute: MPI für Eisenforschung GmbH     Collection: Interface Chemistry and Surface Engineering     Display Documents



  history
ID: 670325.0, MPI für Eisenforschung GmbH / Interface Chemistry and Surface Engineering
Composition-Dependent Oxygen Reduction Activity and Stability of Pt–Cu Thin Films
Authors:Schuppert, A. K.; Topalov, A. A.; Savan, A.; Ludwig, A.; Mayrhofer, K. J. J.
Language:English
Date of Publication (YYYY-MM-DD):2014-02-11
Title of Journal:Chemelectrochem Communications
Journal Abbrev.:ChemElectroChem
Volume:1
Issue / Number:2
Start Page:358
End Page:361
Review Status:not specified
Audience:Not Specified
External Publication Status:published
Document Type:Article
Affiliations:MPI für Eisenforschung GmbH
Identifiers:DOI:10.1002/celc.201300078
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