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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Ehemalige Abt. Arzt (Micro/nanomechanics of Thin Films and Biological Systems)     Display Documents



  history
ID: 6732.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Ehemalige Abt. Arzt (Micro/nanomechanics of Thin Films and Biological Systems)
Microstructural evolution in passivated Al films on Si substrates during thermal cycling
Authors:Legros, M.; Hemker, K. J.; Gouldstone, A.; Suresh, S.; Keller-Flaig, R.-M.; Arzt, E.
Language:English
Date of Publication (YYYY-MM-DD):2002-08-01
Title of Journal:Acta Materialia
Journal Abbrev.:Acta Mater.
Volume:50
Issue / Number:13
Start Page:3435
End Page:3452
Review Status:Peer-review
Audience:Experts Only
Free Keywords:in situ TEM; thin films; Al; plastic deformation; dislocations
External Publication Status:published
Document Type:Article
Affiliations:MPI für Metallforschung/Abt. Arzt
External Affiliations:Ecole Mines, CNRS, Lab Phys Mat, Parc Saurupt, F-54042 Nancy,; France; Johns Hopkins Univ, Dept Mech Engn, Baltimore, MD 21218 USA; MIT, Dept Mat Sci & Engn, Cambridge, MA 02139 USA;
Identifiers:ISI:000177559400012
ISSN:1359-6454
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