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Home Search Quick Search Advanced Fulltext Browse Collections Persons My eDoc Session History Login Name: Password: Documentation Help Support Wiki Direct access to document ID:	Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Ehemalige Abt. Arzt (Micro/nanomechanics of Thin Films and Biological Systems)     Display Documents   history ID: 6732.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Ehemalige Abt. Arzt (Micro/nanomechanics of Thin Films and Biological Systems) Microstructural evolution in passivated Al films on Si substrates during thermal cycling Authors: Legros, M.; Hemker, K. J.; Gouldstone, A.; Suresh, S.; Keller-Flaig, R.-M.; Arzt, E. Language: English Date of Publication (YYYY-MM-DD): 2002-08-01 Title of Journal: Acta Materialia Journal Abbrev.: Acta Mater. Volume: 50 Issue / Number: 13 Start Page: 3435 End Page: 3452 Review Status: Peer-review Audience: Experts Only Free Keywords: in situ TEM; thin films; Al; plastic deformation; dislocations External Publication Status: published Document Type: Article Affiliations: MPI für Metallforschung/Abt. Arzt External Affiliations: Ecole Mines, CNRS, Lab Phys Mat, Parc Saurupt, F-54042 Nancy,; France; Johns Hopkins Univ, Dept Mech Engn, Baltimore, MD 21218 USA; MIT, Dept Mat Sci & Engn, Cambridge, MA 02139 USA; Identifiers: ISI:000177559400012 ISSN:1359-6454 The scope and number of records on eDoc is subject to the collection policies defined by each institute - see "info" button in the collection browse view.