Please note that eDoc will be permanently shut down in the first quarter of 2021!      Home News About Us Contact Contributors Disclaimer Privacy Policy Help FAQ

Home
Search
Quick Search
Advanced
Fulltext
Browse
Collections
Persons
My eDoc
Session History
Login
Name:
Password:
Documentation
Help
Support Wiki
Direct access to
document ID:


          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Ehemalige Abt. Arzt (Micro/nanomechanics of Thin Films and Biological Systems)     Display Documents



  history
ID: 6778.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Ehemalige Abt. Arzt (Micro/nanomechanics of Thin Films and Biological Systems)
Dislocation dynamics in sub-micron confinement: recent progress in Cu thin film plasticity
Authors:Dehm, G.; Balk, T. J.; von Blanckenhagen, B.; Gumbsch, P.; Arzt, E.
Language:English
Date of Publication (YYYY-MM-DD):2002-05
Title of Journal:Zeitschrift für Metallkunde
Journal Abbrev.:Z. Metallk.
Volume:93
Issue / Number:5
Start Page:383
End Page:391
Review Status:Peer-review
Audience:Experts Only
Free Keywords:06-ar_2002;
thin film plasticity; discrete dislocation dynamics; constrained diffusional creep; in situ TEM; thermal stress
External Publication Status:published
Document Type:Article
Affiliations:MPI für Metallforschung/Abt. Arzt
External Affiliations:Univ Stuttgart, Inst Met Kunde, D-7000 Stuttgart, Germany
Identifiers:ISI:000176310600007
ISSN:0044-3093
Full Text:
Sorry, no privileges
The scope and number of records on eDoc is subject to the collection policies defined by each institute - see "info" button in the collection browse view.