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          Institute: MPI für Festkörperforschung     Collection: FKF Publikationen 2003     Display Documents



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ID: 7052.0, MPI für Festkörperforschung / FKF Publikationen 2003
The X-ray characterization of Bi2Sr2CaCu2O8+x single crystals grown by different methods
Authors:Bdikin, I. K.; Maljuk, A. N.; Kulakov, A. B.; Lin, C. T.; Kumar, P.; Kumar, B.; Trigunayat, G. C.; Emel'chenko, G. A.
Language:English
Date of Publication (YYYY-MM-DD):2003
Title of Journal:Physica C
Volume:383
Issue / Number:4
Start Page:431
End Page:437
Review Status:Peer-review
Audience:Not Specified
Abstract / Description:We report on results of systematic X-ray investigations of the
Bi2Sr2CaCU2O8+x (2212) single crystals grown by slow cooling,
top seeded solution growth and travelling solvent floating zone
(TSFZ) methods. The typical concentrations of dislocations in
the Bi-2212 crystals are estimated from width of peaks.
According to the obtained X-ray topography and diffractometry
data, these crystals demonstrate misorientation anisotropy
around different crystallographic axes, which is a consequence
of incommensurate modulation in this compound. The highly
perfect crystals grown by TSFZ method are found to demonstrate
the abnormal transmission X-ray diffraction effect (Borrman
effect). (C) 2002 Elsevier Science B.V. All rights reserved.
Free Keywords:X-ray topography; microstructure; Bi2Sr2CaCu2O8+x; methods of
crystal growth
External Publication Status:published
Document Type:Article
Communicated by:Michaela Asen-Palmer
Affiliations:MPI für Festkörperforschung
External Affiliations:; Russian Acad Sci, Inst Solid State Phys, Chernogolovka 142432, Moscow Distr, Russia
; Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany
; Univ Delhi, Dept Phys & Astrophys, Delhi 110007, India
Identifiers:ISI:000180307200019
ISSN:0921-4534
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