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          Institute: MPI für Physik     Collection: YB 2016     Display Documents



ID: 716371.0, MPI für Physik / YB 2016
Production quality characterisation techniques of sensors and prototypes for the BELLE II Pixel Detector
Authors:Avella, P.; Andricek, L.; Koffmane, C.; Lehmann, R.; Liemann, G.; Moser, H-G.; Ninkovic, J.; Richter, R. H.; Ritter, A.; Scheugenpflug, E.; Schaller, G.; Schopper, F.; Schnecke, M.; Valentan, M.; Wassatsch, A.
Date of Publication (YYYY-MM-DD):2015
Title of Journal:Journal of Instrumentation
Journal Abbrev.:J.Inst.
Issue / Number:10
Audience:Not Specified
Intended Educational Use:No
Abstract / Description:The Belle II detector is a system currently under upgrade at the B-factory SuperKEKB in Tsukuba, Japan. The main novelty is the introduction of an additional position sensitive sub-detector in the vertex detector, between the beam pipe and the strip detector system. The sensor of choice for the Belle II Pixel Detector is the Depleted p-channel Field Effect Transistor (DEPFET) sensor. In this paper the latest production of sensors and prototypes performed at the semiconductor Laboratory of the Max Planck Society, i.e. the PXD9 and the Electrical Multi-Chip Module (EMCM), are described. Wafer-level characterisation methods and techniques for faults in the metal system are also reported.
Classification / Thesaurus:Belle II
External Publication Status:published
Document Type:Conference-Paper
Communicated by:MPI für Physik
Affiliations:MPI für Physik
Identifiers:LOCALID:MPP-2015-413
URL:http://iopscience.iop.org/1748-0221/10/01/C01049
URL:https://publications.mppmu.mpg.de/?action=search&m...
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