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          Institute: MPI für Festkörperforschung     Collection: FKF Publikationen 2002     Display Documents



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ID: 7212.0, MPI für Festkörperforschung / FKF Publikationen 2002
Fluorescence spectroscopy and transmission electron microscopy of the same isolated semiconductor nanocrystals
Authors:Koberling, F.; Mews, A.; Philipp, G.; Kolb, U.; Potapova, I.; Burghard, M.; Basché, T.
Language:English
Date of Publication (YYYY-MM-DD):2002
Title of Journal:Applied Physics Letters
Volume:81
Issue / Number:6
Start Page:1116
End Page:1118
Review Status:Peer-review
Audience:Not Specified
Abstract / Description:We present a method to establish a correlation between the
crystalline structure and the fluorescence properties of
isolated semiconductor nanocrystals. By using ultrathin silicon
nitride substrates with markers, we have localized and
investigated the same particles in both a high-resolution
transmission electron microscope (TEM) and a confocal optical
microscope. We have found that the observation of strong
fluorescence emission does not require single domain particles.
Additionally, we have correlated the size and shape of a
particle as determined by TEM and its spectral properties like
emission wavelength and spectral diffusion. (C) 2002 American
Institute of Physics.
External Publication Status:published
Document Type:Article
Communicated by:Michaela Asen-Palmer
Affiliations:MPI für Festkörperforschung
External Affiliations:; Univ Mainz, Inst Phys Chem, D-55099 Mainz, Germany
; Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany
Identifiers:ISI:000177171400056
ISSN:0003-6951
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