Home News About Us Contact Contributors Disclaimer Privacy Policy Help FAQ

Home
Search
Quick Search
Advanced
Fulltext
Browse
Collections
Persons
My eDoc
Session History
Login
Name:
Password:
Documentation
Help
Support Wiki
Direct access to
document ID:


          Institute: MPI für Astronomie     Collection: Publikationen_mpia     Display Documents



ID: 731523.0, MPI für Astronomie / Publikationen_mpia
The metrology system of the VLTI instrument GRAVITY
Authors:Lippa, M.; Gillessen, S.; Blind, N.; Kok, Y.; Yazıcı, Ş.; Weber, J.; Pfuhl, O.; Haug, M.; Kellner, S.; Wieprecht, E.; Eisenhauer, F.; Genzel, R.; Hans, O.; Haußmann, F.; Huber, D.; Kratschmann, T.; Ott, T.; Plattner, M.; Rau, C.; Sturm, E.; Waisberg, I.; Wiezorrek, E.; Perrin, G.; Perraut, K.; Brandner, W.; Straubmeier, C.; Amorim, A.
Date of Publication (YYYY-MM-DD):2016
Audience:Not Specified
Abstract / Description:The VLTI instrument GRAVITY combines the beams from four telescopes and provides phase-referenced imaging as well as precision-astrometry of order 10 μas by observing two celestial objects in dual-field mode. Their angular separation can be determined from their differential OPD (dOPD) when the internal dOPDs in the interferometer are known. Here, we present the general overview of the novel metrology system which performs these measurements. The metrology consists of a three-beam laser system and a homodyne detection scheme for three-beam interference using phase-shifting interferometry in combination with lock-in amplifiers. Via this approach the metrology system measures dOPDs on a nanometer-level.
External Publication Status:published
Document Type:Other
Communicated by:N. N.
Affiliations:MPI für Astronomie
Identifiers:URL:http://adsabs.harvard.edu/abs/2016SPIE.9907E..22L
The scope and number of records on eDoc is subject to the collection policies defined by each institute - see "info" button in the collection browse view.