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          Institute: MPI für Festkörperforschung     Collection: FKF Publikationen 2002     Display Documents



  history
ID: 7360.0, MPI für Festkörperforschung / FKF Publikationen 2002
X-ray absorption and photoemission electron spectroscopic investigation of crystalline and amorphous barium silicates
Authors:Bender, S.; Franke, R.; Hartmann, E.; Lansmann, V.; Jansen, M.; Hormes, J.
Language:English
Date of Publication (YYYY-MM-DD):2002
Title of Journal:Journal of Non-Crystalline Solids
Volume:298
Issue / Number:2-3
Start Page:99
End Page:108
Review Status:Peer-review
Audience:Not Specified
Abstract / Description:X-ray absorption near edge structure (XANES) measurements at
the Si K-edge, X-ray photoelectron spectroscopy of the Si 2p
and 0 1 s photoelectrons and X-ray excited Auger electron
spectroscopy of the Si KLL Auger electrons are applied in order
to investigate the degree of polymerisation (Q(n)) of the
SiO4)-Polyhedra in barium silicate glasses with different BaO-
contents. The spectra of the glasses with 33.3 and 37.0 mol%
BaO are compared to those of the crystalline reference
compounds: low quartz, BaSi2O5, BaSiO3 and Ba2SiO4. The
analysis reveals a high average polymerisation between Q(3) and
Q(4) in both glasses. The results are supported by calculations
of the bound state transitions in Si K-XANES using the multiple
scattering Xalpha method. (C) 2002 Published by Elsevier
Science B.V.
External Publication Status:published
Document Type:Article
Communicated by:Michaela Asen-Palmer
Affiliations:MPI für Festkörperforschung
External Affiliations:; Univ Bonn, Inst Phys, Nussallee 12, D-53115 Bonn, Germany
; Inst Oberflachenmodifizierung, D-04303 Leipzig, Germany
; Univ Bonn, Inst Anorgan Chem, D-53121 Bonn, Germany
; Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany
; Ctr Adv Microstruct & Devices, Baton Rouge, LA 70806 USA
Identifiers:ISI:000174805000001
ISSN:0022-3093
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