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Structural investigation of Silicalite-I loaded with n-hexane by X-ray diffraction, Si-29 MAS NMR, and molecular modeling
Authors: Morell, H.; Angermund, K.; Lewis, A. R.; Brouwer, D. H.; Fyfe, C. A.; Gies, H.
Date of Publication (YYYY-MM-DD): 2002-05
Title of Journal: Chemistry of Materials
Volume: 14
Issue / Number: 5
Start Page: 2192
End Page: 2198
Document Type: Article
ID: 20101.0
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