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Entries: 1-10  
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Titanium–silicon oxide film structures for polarization-modulated infrared reflection absorption spectroscopy
Authors: Dunlop, I. E.; Zorn, S.; Richter, G.; Srot, V.; Kelsch, M.; van Aken, P. A.; Skoda, M.; Gerlach, A.; Spatz, J. P.; Schreiber, F.
Date of Publication (YYYY-MM-DD): 2009
Title of Journal: Thin Solid Films
Volume: 517
Start Page: 2048
End Page: 2054
Document Type: Article
ID: 397148.0
Titanium-silicon oxide film structures for polarization-modulated infrared reflection absorption spectroscopy
Authors: Dunlop, I. E.; Zorn, S.; Richter, G.; Srot, V.; Kelsch, M.; van Aken, P. .; Skoda, M.; Gerlach, A.; Spatz, J. P.; Schreiber, F.
Date of Publication (YYYY-MM-DD): 2009
Title of Journal: Thin Solid Films
Volume: 517
Start Page: 2048
End Page: 2054
Document Type: Article
ID: 398650.0
Titanium-silicon oxide film structures for polarization-modulated infrared reflection absorption spectroscopy
Authors: Dunlop, I. E.; Zorn, S.; Richter, G.; Srot, V.; Kelsch, M.; van Aken, P. .; Skoda, M.; Gerlach, A.; Spatz, J. P.; Schreiber, F.
Date of Publication (YYYY-MM-DD): 2009
Title of Journal: Thin Solid Films
Volume: 517
Start Page: 2048
End Page: 2054
Document Type: Article
ID: 412628.0
In-situ X-ray scattering studies of OFET interfaces
Authors: Gerlach, A.; Sellner, S.; Kowarik, S.; Schreiber, F.
Date of Publication (YYYY-MM-DD): 2008-02-25
Title of Journal: Physica Status Solidi A
Volume: 205
Issue / Number: 3
Start Page: 461
End Page: 474
Document Type: Article
ID: 414446.0
Comparative study of the growth of sputtered aluminum oxide films on organic and inorganic substrates
Authors: Sellner, S.; Gerlach, A.; Kowarik, S.; Schreiber, F.; Dosch, H.; Meyer, S.; Pflaum, J.; Ulbricht, G.
Date of Publication (YYYY-MM-DD): 2008
Title of Journal: Thin Solid Films
Issue / Number: 516
Start Page: 6377
End Page: 6381
Document Type: Article
ID: 361973.0
Real-time observation of structural and orientational transitions during growth of organic thin films
Authors: Kowarik, S.; Gerlach, A.; Sellner, S.; Schreiber, F.; Cavalcanti, L.; Konovalov, O.
Date of Publication (YYYY-MM-DD): 2006-03-30
Title of Journal: Physical Review Letters
Volume: 96
Start Page: 1
End Page: 4
Sequence Number of Article: 125504
Document Type: Article
ID: 285373.0
Mechanisms for the enhancement of the thermal stability of organic thin films by aluminum oxide capping layers
Authors: Sellner, S.; Kelsch, M.; Kasper, N.; Dosch, H.; Ulbricht, G.; Gerlach, A.; Schreiber, F.; Meyer, S.; Pflaum, J.; Fischer, M.; Gompf, B.
Date of Publication (YYYY-MM-DD): 2006-02-02
Title of Journal: Journal of Materials Research
Volume: 21
Issue / Number: 2
Start Page: 455
End Page: 464
Document Type: Article
ID: 265826.0
Mechanisms for the enhancement of the thermal stability of organic thin films by aluminum oxide capping layers
Authors: Sellner, S.; Gerlach, A.; Schreiber, F.; Kelsch, M.; Kasper, N.; Dosch, H.; Meyer, S.; Pflaum, J.; Fischer, M.; Gompf, B.; Ulbricht, G.
Date of Publication (YYYY-MM-DD): 2006
Title of Journal: Journal of Materials Research
Volume: 21
Issue / Number: 2
Start Page: 455
End Page: 464
Document Type: Article
ID: 273457.0
Adsorption-induced distortion of F16CuPc on Cu(111) and Ag(111): an X-ray standing wave
Authors: Gerlach, A.; Schreiber, F.; Sellner, S.; Dosch, H.; Vartanyants, I. A.; Cowie, B. C.; Lee, T. L.; Zegenhagen, J.
Date of Publication (YYYY-MM-DD): 2005-05-31
Title of Journal: Physical Review B
Volume: 71
End Page: 7
Sequence Number of Article: 205425
Document Type: Article
ID: 238054.0
Strongly enhanced thermal stability of crystalline organic thin films induced by aluminum oxide capping layers
Authors: Sellner, S.; Gerlach, A.; Schreiber, F.; Kelsch, M.; Kasper, N.; Dosch, H.; Meyer, S.; Pflaum, J.; Fischer, M.; Gompf, B.
Date of Publication (YYYY-MM-DD): 2004-10
Title of Journal: Advanced Materials
Volume: 16
Issue / Number: 19
Start Page: 1750
End Page: 1753
Document Type: Article
ID: 210842.0
Entries: 1-10  
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